- Volume 25,Issue 1,2004 Table of Contents
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María S. Jiménez , Rosario Velarte , María T. Gomez , Juan R. Castillo
2004, 25(1):1-12. DOI: 10.46770/AS.2004.01.001
Abstract:
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Man He , Bin Hu , Zucheng Jiang , Yan Zeng
2004, 25(1):13-20. DOI: 10.46770/AS.2004.01.002
Abstract:The analytical procedure for the determination of trace rare earth impurities in high purity neodymium oxide (Nd2O3) by ICP-MS is described. The effect of ICP-MS operating parameters on the REO(H)(+)/RE+ production ratio was studied in detail, and the optimal ICP operating conditions were established. In this context, the relationship between REO(H)(+)/RE+ production ratio and the bond strength of the rare earth oxides is also discussed briefly. For the correction of the spectral interference induced by the matrix (neodymium), a simple correction equation was used for correcting the interferences of the polyatomic ions NdO+ and NdOH+ with Tb-159 and Ho-165. The proposed method was applied to the determination of trace rare earth impurities in high purity Nd2O3\, and the analytical results were in good agreement with the recommended reference values.
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Daniel Hammer , Marija Basic-Dvorzak , Lo?c Perring
2004, 25(1):30-36. DOI: 10.46770/AS.2004.01.004
Abstract:
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Rebeca Santamaría-Fernández , Sandra Santiago-Rivas , Antonio Moreda-Pi?eiro , Adela Bermejo-Barrera , Pilar Bermejo-Barrera , Steve. J. Hill
2004, 25(1):37-43. DOI: 10.46770/AS.2004.01.005
Abstract:
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A. Lopez-Molinero , M.A. Cebrian , J.R. Castillo
2004, 25(1):44-51. DOI: 10.46770/AS.2004.01.006
Abstract:
Supported by:Beijing E-Tiller Technology Development Co., Ltd.